Role of Nanoscale Roughness and Polarity in Odd–Even Effect of Self‐Assembled Monolayers

The dependency of substrate roughness on wetting properties of self‐assembled monolayers (SAMs) has been studied extensively, but most previous studies used limited selection of probing liquid and range of surface roughness. These studies disregarded the limit to observation of sub‐nanometer odd–eve...

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Detalles Bibliográficos
Autores principales: Du, Chuanshen, Wang, Zhengjia, Chen, Jiahao, Martin, Andrew, Raturi, Dhruv, Thuo, Martin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2022
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9400998/
https://www.ncbi.nlm.nih.gov/pubmed/35580255
http://dx.doi.org/10.1002/anie.202205251

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9400998/
https://www.ncbi.nlm.nih.gov/pubmed/35580255
http://dx.doi.org/10.1002/anie.202205251

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