Al(1−x)Sc(x)N Thin Films at High Temperatures: Sc-Dependent Instability and Anomalous Thermal Expansion

Ferroelectric thin films of wurtzite-type aluminum scandium nitride (Al(1−x)Sc(x)N) are promising candidates for non-volatile memory applications and high-temperature sensors due to their outstanding functional and thermal stability exceeding most other ferroelectric thin film materials. In this wor...

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Detalles Bibliográficos
Autores principales: Wolff, Niklas, Islam, Md Redwanul, Kirste, Lutz, Fichtner, Simon, Lofink, Fabian, Žukauskaitė, Agnė, Kienle, Lorenz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9412885/
https://www.ncbi.nlm.nih.gov/pubmed/36014204
http://dx.doi.org/10.3390/mi13081282

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9412885/
https://www.ncbi.nlm.nih.gov/pubmed/36014204
http://dx.doi.org/10.3390/mi13081282

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