An Experimental Investigation of the Degradation of CMOS Low-Noise Amplifier Specifications at Different Temperatures

To investigate the relationship between the specifications degradation of a low-noise amplifier (LNA) and temperature, we experimentally investigated the degradation characteristics of the specifications of the LNA at different temperatures. The small-signal gain (S21) of the LNA decreases with incr...

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Detalles Bibliográficos
Autores principales: Zhou, Shaohua, Wang, Jian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9415183/
https://www.ncbi.nlm.nih.gov/pubmed/36014190
http://dx.doi.org/10.3390/mi13081268

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9415183/
https://www.ncbi.nlm.nih.gov/pubmed/36014190
http://dx.doi.org/10.3390/mi13081268

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