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Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode
The defectiveness of InGaN-based quantum wells increases with low indium contents, due to the compressive strain induced by the lattice mismatch between the InGaN and GaN layers, and to the stronger incorporation of defects favored by the presence of indium. Such defects can limit the performance an...
Autores principales: | Casu, Claudia, Buffolo, Matteo, Caria, Alessandro, De Santi, Carlo, Zanoni, Enrico, Meneghesso, Gaudenzio, Meneghini, Matteo |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9416485/ https://www.ncbi.nlm.nih.gov/pubmed/36014188 http://dx.doi.org/10.3390/mi13081266 |
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