Data acquisition and imaging using wavelet transform: a new path for high speed transient force microscopy

The unique ability of Atomic Force Microscopy (AFM) to image, manipulate and characterize materials at the nanoscale has made it a remarkable tool in nanotechnology. In dynamic AFM, acquisition and processing of the photodetector signal originating from probe–sample interaction is a critical step in...

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Detalles Bibliográficos
Autores principales: Farokh Payam, Amir, Biglarbeigi, Pardis, Morelli, Alessio, Lemoine, Patrick, McLaughlin, James, Finlay, Dewar
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2020
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9417248/
https://www.ncbi.nlm.nih.gov/pubmed/36131753
http://dx.doi.org/10.1039/d0na00531b

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9417248/
https://www.ncbi.nlm.nih.gov/pubmed/36131753
http://dx.doi.org/10.1039/d0na00531b

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