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Data acquisition and imaging using wavelet transform: a new path for high speed transient force microscopy
The unique ability of Atomic Force Microscopy (AFM) to image, manipulate and characterize materials at the nanoscale has made it a remarkable tool in nanotechnology. In dynamic AFM, acquisition and processing of the photodetector signal originating from probe–sample interaction is a critical step in...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
RSC
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9417248/ https://www.ncbi.nlm.nih.gov/pubmed/36131753 http://dx.doi.org/10.1039/d0na00531b |