Electrostatically-blind quantitative piezoresponse force microscopy free of distributed-force artifacts

The presence of electrostatic forces and associated artifacts complicates the interpretation of piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). Eliminating these artifacts provides an opportunity for precisely mapping domain wall structures and dynamics, accurately...

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Detalles Bibliográficos
Autores principales: Killgore, Jason P., Robins, Larry, Collins, Liam
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2022
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9418616/
https://www.ncbi.nlm.nih.gov/pubmed/36133417
http://dx.doi.org/10.1039/d2na00046f

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9418616/
https://www.ncbi.nlm.nih.gov/pubmed/36133417
http://dx.doi.org/10.1039/d2na00046f

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