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Electrostatically-blind quantitative piezoresponse force microscopy free of distributed-force artifacts
The presence of electrostatic forces and associated artifacts complicates the interpretation of piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). Eliminating these artifacts provides an opportunity for precisely mapping domain wall structures and dynamics, accurately...
Autores principales: | Killgore, Jason P., Robins, Larry, Collins, Liam |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
RSC
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9418616/ https://www.ncbi.nlm.nih.gov/pubmed/36133417 http://dx.doi.org/10.1039/d2na00046f |
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