Correlation analysis of vibration modes in physical vapour deposited Bi(2)Se(3) thin films probed by the Raman mapping technique

In this work, the Raman spectroscopy mapping technique is used for the analysis of mechanical strain in Bi(2)Se(3) thin films of various (3–400 nm) thicknesses synthesized by physical vapour deposition on amorphous quartz and single-layer graphene substrates. The evaluation of strain effects is base...

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Detalles Bibliográficos
Autores principales: Niherysh, K. A., Andzane, J., Mikhalik, M. M., Zavadsky, S. M., Dobrokhotov, P. L., Lombardi, F., Prischepa, S. L., Komissarov, I. V., Erts, D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2021
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419075/
https://www.ncbi.nlm.nih.gov/pubmed/36133484
http://dx.doi.org/10.1039/d1na00390a

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419075/
https://www.ncbi.nlm.nih.gov/pubmed/36133484
http://dx.doi.org/10.1039/d1na00390a

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