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Correlation analysis of vibration modes in physical vapour deposited Bi(2)Se(3) thin films probed by the Raman mapping technique
In this work, the Raman spectroscopy mapping technique is used for the analysis of mechanical strain in Bi(2)Se(3) thin films of various (3–400 nm) thicknesses synthesized by physical vapour deposition on amorphous quartz and single-layer graphene substrates. The evaluation of strain effects is base...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
RSC
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419075/ https://www.ncbi.nlm.nih.gov/pubmed/36133484 http://dx.doi.org/10.1039/d1na00390a |