Dynamics of the charging-induced imaging instability in transmission electron microscopy

Revolutionary microscopy technologies for aberration correction in spatial and energy aspects have exhibited continuous progress, pushing forward the information limit of materials research down to a scale of sub-angstrom and milli-electron voltage. Nevertheless, imaging quality could still suffer d...

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Detalles Bibliográficos
Autores principales: Wang, Linhai, Liu, Dongdong, Zhang, Fan, Zhang, Zhenyu, Cui, Junfeng, Jia, Zhenghao, Yu, Zhibin, Lv, Yiqiang, Liu, Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2021
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419410/
https://www.ncbi.nlm.nih.gov/pubmed/36133648
http://dx.doi.org/10.1039/d1na00140j

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9419410/
https://www.ncbi.nlm.nih.gov/pubmed/36133648
http://dx.doi.org/10.1039/d1na00140j

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