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Acceptor defects in polycrystalline Ge layers evaluated using linear regression analysis
Polycrystalline Ge thin films have recently attracted renewed attention as a material for various electronic and optical devices. However, the difficulty in the Fermi level control of polycrystalline Ge films owing to their high density of defect-induced acceptors has limited their application in th...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9440008/ https://www.ncbi.nlm.nih.gov/pubmed/36056074 http://dx.doi.org/10.1038/s41598-022-19221-5 |