Expected affine: A registration method for damaged section in serial sections electron microscopy

Registration is essential for the volume reconstruction of biological tissues using serial section electron microscope (ssEM) images. However, due to environmental disturbance in section preparation, damage in long serial sections is inevitable. It is difficult to register the damaged sections with...

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Detalles Bibliográficos
Autores principales: Xin, Tong, Shen, Lijun, Li, Linlin, Chen, Xi, Han, Hua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Neuroinformatics
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9478550/
https://www.ncbi.nlm.nih.gov/pubmed/36120082
http://dx.doi.org/10.3389/fninf.2022.944050

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9478550/
https://www.ncbi.nlm.nih.gov/pubmed/36120082
http://dx.doi.org/10.3389/fninf.2022.944050

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