Identification of genetic loci for flag-leaf-related traits in wheat (Triticum aestivum L.) and their effects on grain yield

Flag-leaf-related traits including length (FLL), width (FLW), area (FLA), thickness (FLT), and volume (FLV) of flag leaves are the most important determinants of plant architecture and yield in wheat. Understanding the genetic basis of these traits could accelerate the breeding of high yield wheat v...

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Detalles Bibliográficos
Autores principales: Wang, Ying, Qiao, Ling, Yang, Chenkang, Li, Xiaohua, Zhao, Jiajia, Wu, Bangbang, Zheng, Xingwei, Li, Pengbo, Zheng, Jun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Plant Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9493265/
https://www.ncbi.nlm.nih.gov/pubmed/36160981
http://dx.doi.org/10.3389/fpls.2022.990287

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9493265/
https://www.ncbi.nlm.nih.gov/pubmed/36160981
http://dx.doi.org/10.3389/fpls.2022.990287

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