Grain boundary passivation via balancing feedback of hole barrier modulation in HfO(2-x) for nanoscale flexible electronics

Flexible electronics has attracted considerable attention owing to its enormous potential for practical applications in various fields. However, the massive strain produced during bending degrades the device. Especially at grain boundaries, due to the accumulation of defects, this degradation is exa...

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Detalles Bibliográficos
Autores principales: Kim, Yeon Soo, Chung, Harry, Kwon, Suhyoun, Kim, Jihyun, Jo, William
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Nature Singapore 2022
Materias:
Full Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9525481/
https://www.ncbi.nlm.nih.gov/pubmed/36180643
http://dx.doi.org/10.1186/s40580-022-00336-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9525481/
https://www.ncbi.nlm.nih.gov/pubmed/36180643
http://dx.doi.org/10.1186/s40580-022-00336-4

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