Microwave Polarization Sensing for Dielectric Materials Based on a Twisted Dual-Layer Meta-Surface

A microwave sensor is proposed based on a chiral twisted dual-layer meta-surface. Elliptical angle and polarization rotation angle are used to characterize the different dielectric constants of materials. The dielectric films consisting of polydimethylsiloxane and barium titanate with volume fractio...

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Detalles Bibliográficos
Autores principales: Xiao, Hong, Yan, Sen, Chen, Juan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571774/
https://www.ncbi.nlm.nih.gov/pubmed/36233997
http://dx.doi.org/10.3390/ma15196655

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571774/
https://www.ncbi.nlm.nih.gov/pubmed/36233997
http://dx.doi.org/10.3390/ma15196655

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