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Microwave Polarization Sensing for Dielectric Materials Based on a Twisted Dual-Layer Meta-Surface
A microwave sensor is proposed based on a chiral twisted dual-layer meta-surface. Elliptical angle and polarization rotation angle are used to characterize the different dielectric constants of materials. The dielectric films consisting of polydimethylsiloxane and barium titanate with volume fractio...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571774/ https://www.ncbi.nlm.nih.gov/pubmed/36233997 http://dx.doi.org/10.3390/ma15196655 |