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Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640

Detalles Bibliográficos
Autores principales: Chen, Yi-Yueh, Lin, Su-Jien, Chang, Shou-Yi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571785/
https://www.ncbi.nlm.nih.gov/pubmed/36234385
http://dx.doi.org/10.3390/ma15196738
_version_ 1784810450284707840
author Chen, Yi-Yueh
Lin, Su-Jien
Chang, Shou-Yi
author_facet Chen, Yi-Yueh
Lin, Su-Jien
Chang, Shou-Yi
author_sort Chen, Yi-Yueh
collection PubMed
description
format Online
Article
Text
id pubmed-9571785
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-95717852022-10-17 Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640 Chen, Yi-Yueh Lin, Su-Jien Chang, Shou-Yi Materials (Basel) Correction MDPI 2022-09-28 /pmc/articles/PMC9571785/ /pubmed/36234385 http://dx.doi.org/10.3390/ma15196738 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Correction
Chen, Yi-Yueh
Lin, Su-Jien
Chang, Shou-Yi
Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640
title Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640
title_full Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640
title_fullStr Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640
title_full_unstemmed Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640
title_short Correction: Chen et al. New n-p Junction Floating Gate to Enhance the Operation Performance of a Semiconductor Memory Device. Materials 2022, 15, 3640
title_sort correction: chen et al. new n-p junction floating gate to enhance the operation performance of a semiconductor memory device. materials 2022, 15, 3640
topic Correction
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571785/
https://www.ncbi.nlm.nih.gov/pubmed/36234385
http://dx.doi.org/10.3390/ma15196738
work_keys_str_mv AT chenyiyueh correctionchenetalnewnpjunctionfloatinggatetoenhancetheoperationperformanceofasemiconductormemorydevicematerials2022153640
AT linsujien correctionchenetalnewnpjunctionfloatinggatetoenhancetheoperationperformanceofasemiconductormemorydevicematerials2022153640
AT changshouyi correctionchenetalnewnpjunctionfloatinggatetoenhancetheoperationperformanceofasemiconductormemorydevicematerials2022153640