Anti-Blooming Clocking for Time-Delay Integration CCDs

This paper presents an investigation of the responsivity of a time-delay integration (TDI) charge-coupled device that employs anti-blooming clocking and uses a varying number of TDI stages. The influence of charge blooming caused by unused TDI stages in a TDI deployed selection scheme is shown exper...

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Detalles Bibliográficos
Autores principales: Piechaczek, Denis Szymon, Schrey, Olaf, Ligges, Manuel, Hosticka, Bedrich, Kokozinski, Rainer
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571889/
https://www.ncbi.nlm.nih.gov/pubmed/36236619
http://dx.doi.org/10.3390/s22197520

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9571889/
https://www.ncbi.nlm.nih.gov/pubmed/36236619
http://dx.doi.org/10.3390/s22197520

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