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An Analysis of Noise in Multi-Bit ΣΔ Modulators with Low-Frequency Input Signals
Digital and smart sensors are commonly implemented using multi-bit [Formula: see text] Modulators. Undesired signals can be present at the ADC input, such as low-frequency signals with medium or high amplitude, as a consequence of mechanical artifacts in the MEMS and/or temporary signal overload. Si...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9572562/ https://www.ncbi.nlm.nih.gov/pubmed/36236556 http://dx.doi.org/10.3390/s22197458 |