Cargando…
A New Cell Topology for 4H-SiC Planar Power MOSFETs for High-Frequency Switching
A new cell topology named the dodecagonal (a polygon with twelve sides, short for Dod) cell is proposed to optimize the gate-to-drain capacitance ([Formula: see text]) and reduce the specific ON-resistance ([Formula: see text]) of 4H-SiC planar power MOSFETs. The Dod and the octagonal (Oct) cells ar...
Autores principales: | Zhu, Shengnan, Liu, Tianshi, Fan, Junchong, Salemi, Arash, White, Marvin H., Sheridan, David, Agarwal, Anant K. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9572954/ https://www.ncbi.nlm.nih.gov/pubmed/36234032 http://dx.doi.org/10.3390/ma15196690 |
Ejemplares similares
-
Effects of JFET Region Design and Gate Oxide Thickness on the Static and Dynamic Performance of 650 V SiC Planar Power MOSFETs
por: Zhu, Shengnan, et al.
Publicado: (2022) -
A SiC Planar MOSFET with an Embedded MOS-Channel Diode to Improve Reverse Conduction and Switching
por: Li, Ping, et al.
Publicado: (2023) -
The Influence of Special Environments on SiC MOSFETs
por: Li, Zhigang, et al.
Publicado: (2023) -
Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests
por: Principato, Fabio, et al.
Publicado: (2021) -
Investigation of 1200 V SiC MOSFETs’ Surge Reliability
por: Li, Huan, et al.
Publicado: (2019)