A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral resolution, and the characterization of various sa...

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Detalles Bibliográficos
Autores principales: Liu, Hao, Ahmed, Zuned, Vranjkovic, Sasa, Parschau, Manfred, Mandru, Andrada-Oana, Hug, Hans J
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2022
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9577238/
https://www.ncbi.nlm.nih.gov/pubmed/36299563
http://dx.doi.org/10.3762/bjnano.13.95

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9577238/
https://www.ncbi.nlm.nih.gov/pubmed/36299563
http://dx.doi.org/10.3762/bjnano.13.95

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