TEM Investigation of Asymmetric Deposition-Driven Crystalline-to-Amorphous Transition in Silicon Nanowires

Controlling the shape and internal strain of nanowires (NWs) is critical for their safe and reliable use and for the exploration of novel functionalities of nanodevices. In this work, transmission electron microscopy was employed to examine bent Si NWs prepared by asymmetric electron-beam evaporatio...

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Detalles Bibliográficos
Autores principales: Zang, Yuan, Li, Lianbi, Hu, Jichao, Li, Lei, Li, Zelong, Li, Zebin, Feng, Song, Zhang, Guoqing, Xia, Caijuan, Pu, Hongbin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9604709/
https://www.ncbi.nlm.nih.gov/pubmed/36295145
http://dx.doi.org/10.3390/ma15207077

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9604709/
https://www.ncbi.nlm.nih.gov/pubmed/36295145
http://dx.doi.org/10.3390/ma15207077

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