Solution-processed thickness engineering of tellurene for field-effect transistors and polarized infrared photodetectors

Research on elemental 2D materials has been experiencing a renaissance in the past few years. Of particular interest is tellurium (Te), which possesses many exceptional properties for nanoelectronics, photonics, and beyond. Nevertheless, the lack of a scalable approach for the thickness engineering...

Descripción completa

Detalles Bibliográficos
Autores principales: Chen, Fangfang, Cao, Dingwen, Li, Juanjuan, Yan, Yong, Wu, Di, Zhang, Cheng, Gao, Lenan, Guo, Zhaowei, Ma, Shihong, Yu, Huihui, Lin, Pei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9606353/
https://www.ncbi.nlm.nih.gov/pubmed/36311419
http://dx.doi.org/10.3389/fchem.2022.1046010

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9606353/
https://www.ncbi.nlm.nih.gov/pubmed/36311419
http://dx.doi.org/10.3389/fchem.2022.1046010

Ejemplares similares