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Solution-processed thickness engineering of tellurene for field-effect transistors and polarized infrared photodetectors
Research on elemental 2D materials has been experiencing a renaissance in the past few years. Of particular interest is tellurium (Te), which possesses many exceptional properties for nanoelectronics, photonics, and beyond. Nevertheless, the lack of a scalable approach for the thickness engineering...
Autores principales: | Chen, Fangfang, Cao, Dingwen, Li, Juanjuan, Yan, Yong, Wu, Di, Zhang, Cheng, Gao, Lenan, Guo, Zhaowei, Ma, Shihong, Yu, Huihui, Lin, Pei |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9606353/ https://www.ncbi.nlm.nih.gov/pubmed/36311419 http://dx.doi.org/10.3389/fchem.2022.1046010 |
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