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TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode
In this paper, a 650 V 4H-SiC trench Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) with a hetero-junction diode (HJD) and double current spreading layers (CSLs) is proposed and studied based on Sentaurus TCAD simulation. The HJD suppresses the turn-on of the parasitic body diode and imp...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9607645/ https://www.ncbi.nlm.nih.gov/pubmed/36296094 http://dx.doi.org/10.3390/mi13101741 |
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author | Wang, Ruoyu Guo, Jingwei Liu, Chang Wu, Hao Huang, Zhiyong Hu, Shengdong |
author_facet | Wang, Ruoyu Guo, Jingwei Liu, Chang Wu, Hao Huang, Zhiyong Hu, Shengdong |
author_sort | Wang, Ruoyu |
collection | PubMed |
description | In this paper, a 650 V 4H-SiC trench Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) with a hetero-junction diode (HJD) and double current spreading layers (CSLs) is proposed and studied based on Sentaurus TCAD simulation. The HJD suppresses the turn-on of the parasitic body diode and improves the performance in the third quadrant. CSLs with different doping concentrations help to lower the on-state resistance as well as the gate-drain capacitance. As a result, the on-state resistance is decreased by 47.82% while the breakdown voltage remains the same and the turn-on and turn-off losses of the proposed structure are reduced by 83.39% and 68.18% respectively, compared to the conventional structure. |
format | Online Article Text |
id | pubmed-9607645 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-96076452022-10-28 TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode Wang, Ruoyu Guo, Jingwei Liu, Chang Wu, Hao Huang, Zhiyong Hu, Shengdong Micromachines (Basel) Article In this paper, a 650 V 4H-SiC trench Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) with a hetero-junction diode (HJD) and double current spreading layers (CSLs) is proposed and studied based on Sentaurus TCAD simulation. The HJD suppresses the turn-on of the parasitic body diode and improves the performance in the third quadrant. CSLs with different doping concentrations help to lower the on-state resistance as well as the gate-drain capacitance. As a result, the on-state resistance is decreased by 47.82% while the breakdown voltage remains the same and the turn-on and turn-off losses of the proposed structure are reduced by 83.39% and 68.18% respectively, compared to the conventional structure. MDPI 2022-10-14 /pmc/articles/PMC9607645/ /pubmed/36296094 http://dx.doi.org/10.3390/mi13101741 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Wang, Ruoyu Guo, Jingwei Liu, Chang Wu, Hao Huang, Zhiyong Hu, Shengdong TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode |
title | TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode |
title_full | TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode |
title_fullStr | TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode |
title_full_unstemmed | TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode |
title_short | TCAD-Based Investigation of a 650 V 4H-SiC Trench MOSFET with a Hetero-Junction Body Diode |
title_sort | tcad-based investigation of a 650 v 4h-sic trench mosfet with a hetero-junction body diode |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9607645/ https://www.ncbi.nlm.nih.gov/pubmed/36296094 http://dx.doi.org/10.3390/mi13101741 |
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