CISS-Based Label-Free Novel Electrochemical Impedimetric Detection of UVC-Induced DNA Damage

[Image: see text] In this work, we demonstrate chiral-induced spin selectivity (CISS)-based label-free electrochemical impedimetric detection of radiation-induced DNA damage using the electrons’ spin as a novel tool of sensing. For this, self-assembled monolayers (SAMs) of short ds-DNA (of length 7....

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Detalles Bibliográficos
Autores principales: Bangruwa, Neeraj, Srivastava, Manish, Mishra, Debabrata
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9609074/
https://www.ncbi.nlm.nih.gov/pubmed/36312421
http://dx.doi.org/10.1021/acsomega.2c04659

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9609074/
https://www.ncbi.nlm.nih.gov/pubmed/36312421
http://dx.doi.org/10.1021/acsomega.2c04659

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