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CISS-Based Label-Free Novel Electrochemical Impedimetric Detection of UVC-Induced DNA Damage
[Image: see text] In this work, we demonstrate chiral-induced spin selectivity (CISS)-based label-free electrochemical impedimetric detection of radiation-induced DNA damage using the electrons’ spin as a novel tool of sensing. For this, self-assembled monolayers (SAMs) of short ds-DNA (of length 7....
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9609074/ https://www.ncbi.nlm.nih.gov/pubmed/36312421 http://dx.doi.org/10.1021/acsomega.2c04659 |