Leaflet Stresses During Full Device Simulation of Crimping to 6 mm in Transcatheter Aortic Valve Implantation, TAVI

BACKGROUND: With continuing growth in transcatheter aortic valve implantation for the treatment of a failing aortic valve, there is increasing interest in prosthetic valve durability and the potential damage caused to leaflets by stress. Whilst most available research into the computational predicti...

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Detalles Bibliográficos
Autor principal: Bressloff, N. W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2022
Materias:
Original Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9616759/
https://www.ncbi.nlm.nih.gov/pubmed/35230649
http://dx.doi.org/10.1007/s13239-022-00614-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9616759/
https://www.ncbi.nlm.nih.gov/pubmed/35230649
http://dx.doi.org/10.1007/s13239-022-00614-6

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