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A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources
The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-crystal d...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9617939/ https://www.ncbi.nlm.nih.gov/pubmed/36309543 http://dx.doi.org/10.1038/s41598-022-23004-3 |