Towards a new level of quantitative treatment of 3D electron diffraction data – in-pattern optical distortions

Electron diffraction patterns unavoidably contain in-plane distortions introduced by electromagnetic lens systems. Geometric correction of different distortion types allows the accuracy of lattice parameter determination to be improved in 3D electron diffraction data.

Detalles Bibliográficos
Autor principal: Gorelik, Tatiana E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Scientific Commentaries
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9634610/
https://www.ncbi.nlm.nih.gov/pubmed/36381149
http://dx.doi.org/10.1107/S2052252522010326

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9634610/
https://www.ncbi.nlm.nih.gov/pubmed/36381149
http://dx.doi.org/10.1107/S2052252522010326

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