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Towards a new level of quantitative treatment of 3D electron diffraction data – in-pattern optical distortions
Electron diffraction patterns unavoidably contain in-plane distortions introduced by electromagnetic lens systems. Geometric correction of different distortion types allows the accuracy of lattice parameter determination to be improved in 3D electron diffraction data.
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9634610/ https://www.ncbi.nlm.nih.gov/pubmed/36381149 http://dx.doi.org/10.1107/S2052252522010326 |