X-ray diffraction with micrometre spatial resolution for highly absorbing samples

X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materia...

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Detalles Bibliográficos
Autores principales: Chakrabarti, Prerana, Wildeis, Anna, Hartmann, Markus, Brandt, Robert, Döhrmann, Ralph, Fevola, Giovanni, Ossig, Christina, Stuckelberger, Michael Elias, Garrevoet, Jan, Falch, Ken Vidar, Galbierz, Vanessa, Falkenberg, Gerald, Modregger, Peter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9641556/
https://www.ncbi.nlm.nih.gov/pubmed/36345748
http://dx.doi.org/10.1107/S1600577522008025

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9641556/
https://www.ncbi.nlm.nih.gov/pubmed/36345748
http://dx.doi.org/10.1107/S1600577522008025

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