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A Study of the Structural and Surface Morphology and Photoluminescence of Ni-Doped AlN Thin Films Grown by Co-Sputtering
Aluminum nitride (AlN) is a semiconductor material possessing a hexagonal wurtzite crystal structure with a large band gap of 6.2 eV. AlN thin films have several potential applications and areas for study, particularly in optoelectronics. This research study focused on the preparation of Ni-doped Al...
Autores principales: | Khan, Mohsin, Nowsherwan, Ghazi Aman, Shah, Aqeel Ahmed, Riaz, Saira, Riaz, Muhammad, Chandio, Ali Dad, Shah, Abdul Karim, Channa, Iftikhar Ahmed, Hussain, Syed Sajjad, Ali, Rashid, Naseem, Shahzad, Shar, Muhammad Ali, Alhazaa, Abdulaziz |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9653990/ https://www.ncbi.nlm.nih.gov/pubmed/36364695 http://dx.doi.org/10.3390/nano12213919 |
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