Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis

Scanning electron microscopy (SEM) is a common method for the analysis of painting micro-samples. The high resolution of this technique offers precise surface analysis and can be coupled with an energy-dispersive spectrometer for the acquisition of the elemental composition. For light microscopy and...

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Detalles Bibliográficos
Autores principales: Jaques, Victory Armida Janine, Zikmundová, Eva, Holas, Jiří, Zikmund, Tomáš, Kaiser, Jozef, Holcová, Katarína
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9668980/
https://www.ncbi.nlm.nih.gov/pubmed/36385138
http://dx.doi.org/10.1038/s41598-022-21882-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9668980/
https://www.ncbi.nlm.nih.gov/pubmed/36385138
http://dx.doi.org/10.1038/s41598-022-21882-1

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