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Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis
Scanning electron microscopy (SEM) is a common method for the analysis of painting micro-samples. The high resolution of this technique offers precise surface analysis and can be coupled with an energy-dispersive spectrometer for the acquisition of the elemental composition. For light microscopy and...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9668980/ https://www.ncbi.nlm.nih.gov/pubmed/36385138 http://dx.doi.org/10.1038/s41598-022-21882-1 |