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Uniform self-rectifying resistive random-access memory based on an MXene-TiO(2) Schottky junction
For filamentary resistive random-access memory (RRAM) devices, the switching behavior between different resistance states usually occurs abruptly, while the random formation of conductive filaments usually results in large fluctuations in resistance states, leading to poor uniformity. Schottky barri...
Autores principales: | Zang, Chao, Li, Bo, Sun, Yun, Feng, Shun, Wang, Xin-Zhe, Wang, Xiaohui, Sun, Dong-Ming |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
RSC
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9680946/ https://www.ncbi.nlm.nih.gov/pubmed/36504734 http://dx.doi.org/10.1039/d2na00281g |
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