Nonlinear and Dotted Defect Detection with CNN for Multi-Vision-Based Mask Inspection

This paper addresses the problem of nonlinear and dotted defect detection for multi-vision-based mask inspection systems in mask manufacturing lines. As the mask production amounts increased due to the spread of COVID-19 around the world, the mask inspection systems require more efficient defect det...

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Detalles Bibliográficos
Autores principales: Woo, Jimyeong, Lee, Heoncheol
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9695745/
https://www.ncbi.nlm.nih.gov/pubmed/36433539
http://dx.doi.org/10.3390/s22228945

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9695745/
https://www.ncbi.nlm.nih.gov/pubmed/36433539
http://dx.doi.org/10.3390/s22228945

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