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Nonlinear and Dotted Defect Detection with CNN for Multi-Vision-Based Mask Inspection
This paper addresses the problem of nonlinear and dotted defect detection for multi-vision-based mask inspection systems in mask manufacturing lines. As the mask production amounts increased due to the spread of COVID-19 around the world, the mask inspection systems require more efficient defect det...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9695745/ https://www.ncbi.nlm.nih.gov/pubmed/36433539 http://dx.doi.org/10.3390/s22228945 |