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Study on Purification Technology of Silicon Carbide Crystal Growth Powder
Silicon carbide (SiC) is a wide-bandgap (WBG) semiconductor material, and its preparation process has strict requirements on the purity of raw materials. A self-developed medium-frequency induction heating furnace was used to carry out powder heat treatment and purification experiments on SiC powder...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9699396/ https://www.ncbi.nlm.nih.gov/pubmed/36431674 http://dx.doi.org/10.3390/ma15228190 |
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author | Fan, Guofeng Li, Tie Zhao, Lili Zhang, Shengtao |
author_facet | Fan, Guofeng Li, Tie Zhao, Lili Zhang, Shengtao |
author_sort | Fan, Guofeng |
collection | PubMed |
description | Silicon carbide (SiC) is a wide-bandgap (WBG) semiconductor material, and its preparation process has strict requirements on the purity of raw materials. A self-developed medium-frequency induction heating furnace was used to carry out powder heat treatment and purification experiments on SiC powder to improve the purity of the powder. Samples with 3.5N purity were analyzed using XRD and GDMS characterization methods. It was found that under conditions of high-temperature (2200 °C) and long-time (50 h) processing, the impurity removal effect was quite good, but the powder loss was as high as 53.42%. The powder loss during the low-temperature (less than 2050 °C) and short-time process was less than 1.5%, but the purification effect was not substantial. After a prolonged processing time, the purification effect of low-temperature heat treatment conditions was improved, but the powder loss was also increased to 30%. In contrast, segmented purification processing at a low temperature in the early stage and a high temperature in the later stage achieved a good purification effect. On the premise of maintaining the utilization rate of raw materials, a 5N-purity SiC source was successfully prepared. The test results show that the contents of free Si, free C and free oxygen impurities were reduced to less than 0.01%, and the contents of Al, B, Fe, Mg, Na, Ti and other impurities were less than 1.15 ppm, which is close to the ppb level. |
format | Online Article Text |
id | pubmed-9699396 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-96993962022-11-26 Study on Purification Technology of Silicon Carbide Crystal Growth Powder Fan, Guofeng Li, Tie Zhao, Lili Zhang, Shengtao Materials (Basel) Article Silicon carbide (SiC) is a wide-bandgap (WBG) semiconductor material, and its preparation process has strict requirements on the purity of raw materials. A self-developed medium-frequency induction heating furnace was used to carry out powder heat treatment and purification experiments on SiC powder to improve the purity of the powder. Samples with 3.5N purity were analyzed using XRD and GDMS characterization methods. It was found that under conditions of high-temperature (2200 °C) and long-time (50 h) processing, the impurity removal effect was quite good, but the powder loss was as high as 53.42%. The powder loss during the low-temperature (less than 2050 °C) and short-time process was less than 1.5%, but the purification effect was not substantial. After a prolonged processing time, the purification effect of low-temperature heat treatment conditions was improved, but the powder loss was also increased to 30%. In contrast, segmented purification processing at a low temperature in the early stage and a high temperature in the later stage achieved a good purification effect. On the premise of maintaining the utilization rate of raw materials, a 5N-purity SiC source was successfully prepared. The test results show that the contents of free Si, free C and free oxygen impurities were reduced to less than 0.01%, and the contents of Al, B, Fe, Mg, Na, Ti and other impurities were less than 1.15 ppm, which is close to the ppb level. MDPI 2022-11-18 /pmc/articles/PMC9699396/ /pubmed/36431674 http://dx.doi.org/10.3390/ma15228190 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Fan, Guofeng Li, Tie Zhao, Lili Zhang, Shengtao Study on Purification Technology of Silicon Carbide Crystal Growth Powder |
title | Study on Purification Technology of Silicon Carbide Crystal Growth Powder |
title_full | Study on Purification Technology of Silicon Carbide Crystal Growth Powder |
title_fullStr | Study on Purification Technology of Silicon Carbide Crystal Growth Powder |
title_full_unstemmed | Study on Purification Technology of Silicon Carbide Crystal Growth Powder |
title_short | Study on Purification Technology of Silicon Carbide Crystal Growth Powder |
title_sort | study on purification technology of silicon carbide crystal growth powder |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9699396/ https://www.ncbi.nlm.nih.gov/pubmed/36431674 http://dx.doi.org/10.3390/ma15228190 |
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