Automated Computer Vision-Enabled Manufacturing of Nanowire Devices

[Image: see text] We present a high-throughput method for identifying and characterizing individual nanowires and for automatically designing electrode patterns with high alignment accuracy. Central to our method is an optimized machine-readable, lithographically processable, and multi-scale fiducia...

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Detalles Bibliográficos
Autores principales: Potočnik, Teja, Christopher, Peter J., Mouthaan, Ralf, Albrow-Owen, Tom, Burton, Oliver J., Jagadish, Chennupati, Tan, Hark Hoe, Wilkinson, Timothy D., Hofmann, Stephan, Joyce, Hannah J., Alexander-Webber, Jack A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9706672/
https://www.ncbi.nlm.nih.gov/pubmed/36162100
http://dx.doi.org/10.1021/acsnano.2c08187

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9706672/
https://www.ncbi.nlm.nih.gov/pubmed/36162100
http://dx.doi.org/10.1021/acsnano.2c08187

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