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Automated Computer Vision-Enabled Manufacturing of Nanowire Devices
[Image: see text] We present a high-throughput method for identifying and characterizing individual nanowires and for automatically designing electrode patterns with high alignment accuracy. Central to our method is an optimized machine-readable, lithographically processable, and multi-scale fiducia...
| Autores principales: | , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9706672/ https://www.ncbi.nlm.nih.gov/pubmed/36162100 http://dx.doi.org/10.1021/acsnano.2c08187 |