A Novel Grain-Based DEM Model for Evaluating Surface Integrity in Scratching of RB-SiC Ceramics

A novel grain-based DEM (Discrete Element Method) model is developed and calibrated to simulate RB-SiC (Reaction-Bonded Silicon Carbide) ceramic and associated scratching process by considering the bonded SiC and Si grains and cementitious materials. It is shown that the grain-based DEM model can ac...

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Detalles Bibliográficos
Autores principales: Qi, Huan, Wang, Yuelei, Qi, Zijian, Shi, Liwu, Fang, Zhufang, Zhang, Li, Riemer, Oltmann, Karpuschewski, Bernhard
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9739719/
https://www.ncbi.nlm.nih.gov/pubmed/36499981
http://dx.doi.org/10.3390/ma15238486

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9739719/
https://www.ncbi.nlm.nih.gov/pubmed/36499981
http://dx.doi.org/10.3390/ma15238486

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