Failure Mechanism of pHEMT in Navigation LNA under UWB EMP

With the development of microelectronic technology, the integration of electronic systems is increasing continuously. Electronic systems are becoming more and more sensitive to external electromagnetic environments. Therefore, to improve the robustness of radio frequency (RF) microwave circuits, it...

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Detalles Bibliográficos
Autores principales: Li, Yonglong, Yu, Bingrui, Chen, Shengxian, Hu, Ming, Zhu, Xiangwei, Yuan, Xuelin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9782252/
https://www.ncbi.nlm.nih.gov/pubmed/36557478
http://dx.doi.org/10.3390/mi13122179

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9782252/
https://www.ncbi.nlm.nih.gov/pubmed/36557478
http://dx.doi.org/10.3390/mi13122179

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