Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy

Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) inve...

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Detalles Bibliográficos
Autores principales: Joseph, C. H., Luzi, Francesca, Azman, S. N. Afifa, Forcellese, Pietro, Pavoni, Eleonora, Fabi, Gianluca, Mencarelli, Davide, Gentili, Serena, Pierantoni, Luca, Morini, Antonio, Simoncini, Michela, Bellezze, Tiziano, Corinaldesi, Valeria, Farina, Marco
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9783995/
https://www.ncbi.nlm.nih.gov/pubmed/36559977
http://dx.doi.org/10.3390/s22249608

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9783995/
https://www.ncbi.nlm.nih.gov/pubmed/36559977
http://dx.doi.org/10.3390/s22249608

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