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4D-STEM Ptychography for Electron-Beam-Sensitive Materials
[Image: see text] Recent advances in high-speed pixelated electron detectors have substantially facilitated the implementation of four-dimensional scanning transmission electron microscopy (4D-STEM). A critical application of 4D-STEM is electron ptychography, which reveals the atomic structure of a...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9801507/ https://www.ncbi.nlm.nih.gov/pubmed/36589892 http://dx.doi.org/10.1021/acscentsci.2c01137 |