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4D-STEM Ptychography for Electron-Beam-Sensitive Materials

[Image: see text] Recent advances in high-speed pixelated electron detectors have substantially facilitated the implementation of four-dimensional scanning transmission electron microscopy (4D-STEM). A critical application of 4D-STEM is electron ptychography, which reveals the atomic structure of a...

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Detalles Bibliográficos
Autores principales:	Li, Guanxing, Zhang, Hui, Han, Yu
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2022
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9801507/ https://www.ncbi.nlm.nih.gov/pubmed/36589892 http://dx.doi.org/10.1021/acscentsci.2c01137

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