Thickness profiling of electron transparent aluminium alloy foil using convergent beam electron diffraction

Convergent beam electron diffraction (CBED) was used to profile the thickness of aluminium alloys foils prepared by using the twinjet electropolishing method. The two‐beam CBED condition was obtained by exciting the [Formula: see text] and [Formula: see text] aluminium diffracted g‐vector. The alumi...

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Detalles Bibliográficos
Autores principales: Bendo, Artenis, Moshtaghi, Masoud, Smith, Matthew, Jin, Zelong, Xiong, Yida, Matsuda, Kenji, Zhou, Xiaorong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2022
Materias:
Original Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9804362/
https://www.ncbi.nlm.nih.gov/pubmed/35916115
http://dx.doi.org/10.1111/jmi.13137

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9804362/
https://www.ncbi.nlm.nih.gov/pubmed/35916115
http://dx.doi.org/10.1111/jmi.13137

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