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Thickness profiling of electron transparent aluminium alloy foil using convergent beam electron diffraction
Convergent beam electron diffraction (CBED) was used to profile the thickness of aluminium alloys foils prepared by using the twinjet electropolishing method. The two‐beam CBED condition was obtained by exciting the [Formula: see text] and [Formula: see text] aluminium diffracted g‐vector. The alumi...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
John Wiley and Sons Inc.
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9804362/ https://www.ncbi.nlm.nih.gov/pubmed/35916115 http://dx.doi.org/10.1111/jmi.13137 |