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Practice of electron microscopy on nanoparticles sensitive to radiation damage: CsPbBr(3) nanocrystals as a case study

In-depth and reliable characterization of advanced nanoparticles is crucial for revealing the origin of their unique features and for designing novel functional materials with tailored properties. Due to their small size, characterization beyond nanometric resolution, notably, by transmission electr...

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Detalles Bibliográficos
Autores principales: Duong, Tuan M., Sharma, Kshipra, Agnese, Fabio, Rouviere, Jean-Luc, Okuno, Hanako, Pouget, Stéphanie, Reiss, Peter, Ling, Wai Li
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9808052/
https://www.ncbi.nlm.nih.gov/pubmed/36605121
http://dx.doi.org/10.3389/fchem.2022.1058620